Wafer‑map yield analysis

Every wafer's failure pattern, in seconds.

Drop the STDF from your prober. Notchmark maps every wafer, labels edge rings, scratches, clusters and center failures, and tells you why. It runs in your browser, so no die data is ever uploaded.

Send us one lot, free Explore a sample lot

STDF V4 · CSV · no install · no account

<60sFrom tester file to first map
0 BDie data uploaded
6Spatial patterns detected
1Lot to start the free pilot

Demo

One lot, 25 wafers, one minute

notchmark · synthetic 25‑wafer lotTry it yourself ↗

Who it's for

For teams that analyse yield in Excel today

SiC & GaN power devices

Low volumes, high die cost, and edge and substrate defects that matter on every wafer.

MEMS & photonics foundries

Many customers and processes, few yield engineers, and data that cannot go to the cloud.

Test houses

Hand every customer a lot report with maps and patterns, not a CSV dump.

Fabless startups

Shuttle and engineering lots where you need answers fast and have no yield platform.

How it works

From tester file to root‑cause lead

Load STDF or CSV

Input

Wafer IDs, hard bins, bin names and pass/fail come straight from the STDF records. Gzipped files and multi‑site probing work too.

Patterns, with the reason

Detect

Edge ring, center, scratch, cluster, edge‑local and random. Every label shows the numbers behind it and where to look in the process.

The whole lot at once

Review

Fail‑bin Pareto with cumulative share, and a stacked map of which die positions fail across every wafer. Copy the summary into a report or MES ticket.

Data security

Your wafer data never leaves your computer

Wafer maps reveal yields, process problems and customer volumes. Notchmark is built so there is nothing to leak.

  • Analysis runs in the browser tabNo server receives die data. You can confirm it in your browser's network panel.
  • No account, no upload, no installEngineers can try it without an IT or security review.
  • Offline desktop version in developmentFor fabs that need an air‑gapped install. Ask about it for your pilot.
Spreadsheets & scriptsEnterprise yield platformsNotchmark
Time to first mapHours per lotWeeks to months of setupUnder a minute
Where data goesLocalA server you or the vendor runStays in your browser
Pattern labelsBy eyeYesYes, with reasons
Who can use itWhoever wrote the macroLicensed seatsAny engineer with a browser

Free pilot · first 10 teams

Send one lot. Get the analysis back the same day.

01Send a lotOne STDF or CSV from wafer sort. Anonymise wafer and lot IDs if you like.
02We analyse itEvery wafer map, the pattern labels and a lot summary.
03Review togetherA 20‑minute call to check findings against what your team already knows.
04Keep using itPilot teams get founding pricing and a say in what we build next.
daniloarseniojoaquim@gmail.com

FAQ

Questions engineers ask first

Which testers and file formats work?

STDF V4 from wafer sort (.stdf, .std or gzipped), and CSV with one row per die (wafer, x, y, bin). Tell us your tester and prober and we will confirm with a sample file before the pilot.

How are patterns detected?

With transparent rules: fail rate by radius, failing edge sectors, and connected clusters of failing dies with their shape. Every label shows the numbers behind it, so you can judge it yourself.

Is anything stored or sent anywhere?

No. Files are read by your browser and processed in memory. Closing the tab discards them.

Does it handle retests and multi‑site probing?

Yes. Results are grouped by wafer per test head, and the last result for each die position is used, so retests replace the first pass.

What does it cost after the pilot?

A per‑engineer subscription priced for small teams, with a site licence for the offline version. Pilot teams lock in founding pricing.